Can Boundary Scan be used for Analog?

As I understand, Boundary Scan compliant devices can be used for to
make sure you don't have any shorts or opens between boundary scan
devices... but what about analog functionality?

For example, if a 1149.1 compliant microcontrollers has a built-in D/
A, can a ATPG test be written such that the full analog swing of the
pin can be tested? Or is TDI/TDO restricted to logic levels only
and arn't meant for analog testing?

If not, anyone know if the new JTAG standards coming down the road
(1149.7, P1587) will have such support? I'd like to use a board test
that actually tests some board functionality logic instead of just
shorts/opens!
.